Abstract
We describe the pulsed-force mode, a new measuring mode for the scanning force microscope to image elastic, electrostatic and adhesive properties simultaneously with topography. The pulsed-force mode reduces lateral shear forces between the tip and the sample. Even very delicate samples can be mapped at high lateral resolution with full control over the force applied to the sample. The achieved scanning speed is comparable to that in contact-mode operation. The pulsed-force mode electronics can easily be added to many microscopes without much alteration of the original set-up. No change of the data acquisition software or of the feedback circuit is necessary.
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