Abstract
To build reliable electron-beam devices, it is necessary to design them so that they are mechanically stable under all operating conditions. In some cases, when the operating temperature in the device reaches a certain level, the thermal deformation of the device components becomes critical and structural instability occurs. This structural instability is one of the key factors in the failure of microwave vacuum devices. The purpose of this paper is to investigate 1) Cathode shadow grid deformation as observed in thermal cycling tests and 2) gyrotron ceramic window deformation caused by a power input of 3000 W.
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