Abstract
SUMMARYThe optimization of STEM‐EDS X‐ray microanalysis within thin metal foils can be achieved by control of the instrumental and specimen variables. The contribution of incident electron probe size, accelerating voltage and sampling frequency together with the specimen variable of foil thickness are discussed with reference to typically enountered microstructural features.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
