Abstract
Ternary compound Cu2SnS3 (CTS) was fabricated by simple, low cost and high efficient spray pyrolysis and rapid thermal annealing route. The influences of annealing temperature and annealing duration on the properties of the prepared CTS thin film were investigated in detail. X-ray diffraction spectrometer, Scanning Electron Microscope, UV–Vis–IR spectrophotometer and I–V test system were employed for the analysis of the structural, morphological, optical and photoelectric properties of the prepared CTS thin film, respectively. The characterization results show that the CTS thin film prepared under the optimal annealing condition of 500 °C and 15 min presents as tetragonal structure with preferential (1,1,2), bandgap value of 1.44 eV, crystal grain size of around 80 nm and photoelectric conversion efficiency as high as 1.24%.
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More From: Journal of Materials Science: Materials in Electronics
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