Abstract
The maximum-entropy method (MEM) was applied to accurate γ-ray diffraction data from MnF2 and NiF2 to explore details of the charge-density distribution. For a fair judgement of the results, Si Pendellōsung data [Saka & Kato (1986). Acta Cryst. A42, 469–478] were also treated. It is shown that conclusions drawn from MEM maps must be accepted with some reserve, particularly in the regions of interest in charge-density studies.
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