Abstract

The dependence of line halfwidth on plasma inhomogeneity and Stark broadening and shift parameters has been investigated by the numerical simulation. It is shown that the increasing of the ratio of Stark shift parameter to Stark width one lowers the inhomogeneity influence on the line profile. When the Stark shift parameter is comparable with Stark width one the function of line halfwidth on plasma optical thickness is the same for the homogeneous plasma and inhomogeneous plasma. It is shown that in case of optical thickness is more than two the function can be expressed by product of function for homogeneous plasma and a factor, which depends on plasma inhomogeneity mainly. The obtained results can be used for plasma optical thickness determining without a using a supplementary light source to scan the plasma.

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