Abstract
In this paper, we analyze four sorts of Pseudo-Random Number (PRN) generators which are widely used in microwave circuit yield analysis and optimization, show that some PRN generators do not satisfy the requirements of simulating statistical models of circuit parameters, and reveal the influence of PRN statistical characteristic on yield analysis and optimization of microwave circuits. Finally, we give some suggestions worth of attention on establishing statistical models of microwave circuits and yield optimization. >
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
