Abstract
Abstract To get insight into the influence of different growth conditions of 1 T-TiSe 2 onto its charge density wave (CDW) phase transition, we have performed angle-resolved photoelectron spectroscopy (ARPES) on TiSe 2 in its CDW phase at low temperatures comparing the results with resistivity measurements. Though the local resistivity maxima become less pronounced with increasing growth temperatures, we do not find this trend in ARPES. While shape and intensity of the emission near E F change drastically, the backfolded valence bands are not affected. The question of the significance of the peaking resistivity as a characteristical ‘fingerprint’ of the CDW phase transition arises.
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