Abstract

The effect of age hardening on the critical resolved shear stress (CRSS) of Cu-0-9 at.% Ti single crystals was measured at 77 K. The scatter of the CRSS values is due to the different Ti concentration in individual samples. The procedure is given to correct this scatter based on the assumption of diffusion controlled new phase formation.

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.