The effects of local illumination and work-rest schedule on light-on test inspection in a TFT-LCD plant

Abstract

The manufacturing processes of TFT-LCD (thin film transistor liquid crystal display) include array process (Array), cell process (Cell) and assembly process (Module) sequentially. The array process is similar to that of being used to fabricate semiconductor devices, which includes cleaning, photolithography, deposition of thin film and etching. The difference between these two processes is the material being used onto which is a glass substrate in TFT-LCD array process, while onto a silicon wafer in semiconductor process. After finishing array process, the glass substrate is combined with a color filter then cut into different size panels as originally specified, and this is the cell process. The cell process also includes liquid injection, polarizer panel combination and panel inspection. The assemblyThe purpose of this study was to identify the important factors that influenced light-on test operators’ visual fatigue and task performance, and to propose countermeasures to improve the problems. First of all, a Fishbone diagram analysis was conducted in the workplace and the light-on test operators were requested to fill out a questionnaire to find out the key factors. The factors that had major influence on light-on test inspection were identified as local illumination and work-rest schedule. Different local illumination levels and work-rest schedule conditions were designed as the experiment variables in this study.