Abstract
This work investigated composition deviations in Ca3Co4O9 (CCO) films during rf-sputtering process and their effects on the properties of post-annealed CCO films. The negative oxygen ions produced during sputtering resulted in a great reduction in deposition rate and preferential re-sputtering of calcium atoms from the substrate due to their lighter weight compared to cobalt. Experiment results showed that the single phase CCO film exhibited the lowest electrical resistivity of ~ 4 mΩ cm at room temperature and a high power factor of ~ 1.1 mW/mK2 at 973 K. Compared with the single phase CCO sample, the resistivity of the Co-rich sample increased slightly and the Seebeck coefficient increased by ~ 20% at high temperature, thereby leading to a high power factor. The upturn of the Seebeck coefficient behaviours in Co-rich samples from 700 K is most likely associated with the strain induced by the mismatch of thermal expansion coefficients (CTE) between CCO and Co3O4 grains.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
More From: Journal of Materials Science: Materials in Electronics
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.