Abstract

We report a study on the effect of spontaneous emission noise present in pulsed probe radiation on the reflectogram shape deformation in a distributed temperature sensor based on Raman scattering of light. Since the fraction of spontaneous emission in the used erbium-doped amplifier can reach 50% of the total power, its influence leads to deviations of reflectograms in the temperature sensor from the theoretical exponential dependence and can result in a temperature measurement error of several degrees.

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