Abstract
The effect of the selective wet chemical etching of the emitting surface on the directivity pattern of radiation in the plane normal to the p-n junction is studied for InGaP/GaAs lasers with InGaAs quantum wells. It is found by atomic-force microscopy that the cylindrical lens (converging or diverging, depending on the type of etchant) is self-formed on the emitting surface due to the different etching rate of wide-gap layers (InGaP) and active layers (GaAs, InGaAs) of the lasers. By adjusting the corresponding etching time, the aperture angle of the laser radiation pattern in the plane normal to the p-n junction can be changed in the range of 57°–82° at the initial aperture angle at the half maximum level of 6°.
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