Abstract
A short electronic mean-free-path results in diffusion limited recombination kinetics. The consequences regarding current-voltage characteristics of p-i-n structures is discussed. In particular, comparison between single injection (n-i-n) and double injection (p-i-n) currents are made. With trapping in a distribution of tail states and recombination only through extended states, the double injection currents are shown to be significantly larger than the single injection space charge limited currents. Comparison with experimental data is made.
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