Abstract
Theoretical expressions for the complementary cumulative function of the Bijvoet ratio X applicable to a truncated data set are worked out for a non-centrosymmetric crystal containing P anomalous scatterers in the unit cell [P = 1 and many (MN and MC cases)] besides a large number of normal scatterers. These expressions contain the truncation limit yt as a parameter of the distribution. The results obtained are used to discuss the effect of data truncation arising from the non-observability of extremely weak reflections on the measurability of Bijvoet differences.
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