Abstract
Editor's note:Statistical approaches for yield estimation and robust design are vital in the current variation-dominated design era. This article presents a mixture importance sampling methodology to enable yield-driven design and extends its application beyond memories to peripheral circuits and logic blocks.—Rahul Rao, IBM
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
