Abstract
Herein, the surface Si/(Si+Al) ratio of a series of FCC catalysts was studied by X-ray Photoelectron Spectroscopy (XPS). Firstly, some of the interferences of the XPS signals from Si, and Al elements were studied and fixed by using the Multiple Linear Regression method (MLR). Subsequently, the Si/(Si+Al) ratio of a set of FCC catalysts was analyzed and this information was correlated with the surface area analysis (BET method). This work showed that the surface Si/(Si+Al) ratio of low deactivated FCC catalyst was lower than its bulk Si/(Si+Al) ratio, suggesting that there is a high content of Al2O3 on the surface of the catalyst when it is slightly deactivated. The surface Si/(Si+Al) ratio of the FCC catalyst increased as the surface area decreased (total and microporous) due to the deactivation of the catalyst; it means that the surface Si/(Si+Al) ratio is strongly affected by the deactivation of the catalyst. The surface Si/(Si+Al) ratio of the equilibrium FCC catalyst samples (Ecat) were very similar to their bulk Si/(Si+Al) ratio. This fact suggests that the surface Si/(Si+Al) ratio of an FCC catalyst progressively increases up to reach the bulk Si/(Si+Al) ratio, therefore the surface Si/(Si+Al) ratio is related to the FCC catalyst deactivation phenomenon.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callMore From: Journal of Electron Spectroscopy and Related Phenomena
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
