The 9th International Symposium on Measurement Science and Intelligent Instruments (ISMTII-2009)

Abstract

The papers for this special feature have been selected for publication after the successful measurement forum that took place in Saint Petersburg, Russia, in 2009. ISMTII-2009 presented state-of-the-art approaches and solutions in the most challenging areas and focused on microscale and nanoscale measurements and metrology; novel measurements and diagnostic technologies, including nondestructive and dimensional inspection; measurements for geometrical and mechanical quantities, terahertz technologies for science, industry and biomedicine; intelligent measuring instruments and systems for industry and transport; optical and x-ray tomography and interferometry, metrology and characterization of materials, measurements and metrology for the humanitarian fields; and education in measurement science. We believe that scientists and specialists around the world found there the newest information on measurement technology and intelligent instruments, and this will stimulate work in these areas which is an essential part of progress in measurement.The ISMTII Symposia have been held successfully every two years from 1989 in the People's Republic of China, Hungary, Egypt, Hong Kong, UK and Japan under the direction of ICMI. In 2009 the ISMTII measuring forum took place in Russia, and it is a great honour for our country, as well as for the Russian Academy of Sciences and its Siberian Branch—Novosibirsk Scientific Center.This Symposium was located in historic Saint Petersburg, which from its foundation has been a unique bridge of communication between countries on all continents, and participation provided an excellent opportunity for the exchange of experience, information and knowledge between specialists from different countries and fields.On behalf of the Organizers, Steering Committee and International Program Committee I would like to thank all the participants for their valuable contributions without which this special feature would not have become reality, as well as the reviewers for their careful evaluation of the papers. My special thanks go to the publishing team of the Measurement Science and Technology journal.