Texture Analysis — A Method of Nondestructive Characterization of Materials I

Abstract

Anisotropic properties of polycrystalline materials of any kind may depend on the orientation distribution of the materials crystallites — the texture. Hence, texture is one of the basic structural parameters of such materials. Textures can be measured by optical and electron--optical methods as well as by diffraction methods e.g. x-rays, neutrons, electrons. This can be done by individual orientation determination or by pole figure measurement followed by pole figure inversion. For property control, only partial texture analysis is required which can be carried out by a fixed angle texture analyzer or by anisotropy measurements (e.g. Young’s modulus, magnetic anisotropy). When mathematical models of texture formation will have been developed, an automatic feed-back property control may finally be possible.