Abstract
Measurements of the resistivity of epitaxial gold films vacuum deposited upon mica were made over the temperature range of 4.2–300 K. A computerized data analysis scheme, in which the operator played the part of a judgment element in the feedback loop, was used to fit the Fuchs-Sondheimer theory of size effects to the experimental data. The specularity parameter could be determined from the data for a single film. The results for films thinner than 4000 Å are that the specularity, p, varied between 0.5 and 0.95 whereas the static lattice imperfection resistance, ρi, varied between 5.2 and 9.0×10−8 Ω-cm.
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