Abstract
A novel method for transient liquid phase (TLP) diffusion bonding of aluminium based materials has been developed which is capable of reliably providing excellent bonds with parent material shear strengths. This new method relies on imposing a temperature gradient across the bond line during TLP diffusion bonding and this leads to the formation of sinusoidal or cellular interfaces. Consequently, bond strengths are increased, possibly as a result of the higher metal–metal contact along the non-planar interfaces compared with the planar interfaces associated with either conventional TLP or solid state diffusion bonding processes. This paper describes the results achieved, implementing the new method and using copper interlayers, when joining Al–Mg–Si, Al–Li alloys, and an aluminium metal matrix composite with SiC particles. Patent protection has been filed in the UK under UK Patent No. 9709167.2.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
