Abstract
We report a scanning microwave near-field microscope that allows temperature-dependent local electromagnetic characterization of electronic materials. We have established a temperature-controlled sample stage cooled by liquid nitrogen, so that the local electromagnetic properties of the sample could be studied through near-field microwave interaction at temperature varying from 80 to 300 K. Using this instrument, we have studied the magnetic phase transition of an Nd 0.7Sr 0.3MnO 3− δ thin film and an ion-pair complex magnetic material, as well as the homogeneity of the microwave surface resistance of a YBa 2Cu 3O 7− δ superconducting thin film. Experiment results have demonstrated the ability of temperature-dependent local microwave characterization of this microwave microscope for different kind of electronic materials.
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