Abstract
Transparent conducting cadmium indium oxide films (CdIn2O4) were deposited on glass substrates at temperature of 350 and 400°C. The film structure and surface morphologies were investigated as a function of temperature by X-ray diffraction (XRD), scanning electron microscopy (SEM) and atomic force microscopy (AFM). The XRD results showed the single phase formation of the material that revealed the presence of Cd2+ and In3+ in the inverse spinel related structure. The chemical compositional analysis of CdIn2O4 films was carried out by X-ray photoelectron spectroscopy (XPS). Room temperature photoluminescence (PL) measurements indicate that the annealed CdIn2O4 thin film exhibit blue shift effect. The optical band gap of CdIn2O4 film was increased from 3.08 to 3.2eV up to 400°C.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
