Abstract
Line defects are ubiquitious features in interfaces, and have important structural and mechanistic role. Recently, a crystallographic theory of such defects has been presented which appears to offer a comprehensive framework for their classification. The object of the present paper is firstly to outline the characterisation and classification of defects according to this treatment. Secondly, we illustrate examples of defects in the distinctive classes observed using tern, and discuss the various imaging techniques which have been employed.In the absence of a rigorous treatment of line defects in single crystals and interfaces, which would require the development of a discrete field theory, approximate methods of defect characterisation are used. The most popular method involves mapping a contour, initially constructed around a defect of interest, into a reference space. For defeats in single crystals this Burgers circuit method, introduced by Frank, is very helpful, but suffers from certain procedural inconveniences in the case of interfacial defects.
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Schedule a callMore From: Proceedings, annual meeting, Electron Microscopy Society of America
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