Abstract
Transmission electron microscopy (TEM) methods were used to analyze the deformation-induced antiphase boundary (APB) tubes in a ${\mathrm{Ni}}_{3}\mathrm{Al}$ single crystal. A high density of tubes is observed after room-temperature deformation showing strong contrasts in some fundamental reflections. This is not expected from a hard sphere model of the APB faults bounding the tubes since in this case the APB faults are just chemical faults (displacement vector ${R}_{C}\ensuremath{\rightarrow}=1/2〈110〉).$ The TEM analysis shows unambiguously that the APB faults contain a small additional structural displacement vector ${R}_{S}\ensuremath{\rightarrow}.$ ${R}_{S}\ensuremath{\rightarrow}$ lies in the plane of the fault and is perpendicular to ${R}_{C}\ensuremath{\rightarrow}.$
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