Abstract
Synthetic test circuits are developed for the operational test of Thyristor Controlled Reactor (TCR) valve and Thyristor Switched Capacitor (TSC) valve. The synthetic test current circuits are independent controllable in current stress and voltage stress applied on the test object. By careful design of circuit parameters those test circuits can produce test stresses on TCR valve or TSC valve equal to or greater than those that are foreseen to appear in service. Tests on several TCR and TSC valves have proved that those new synthetic test circuits are a technical sound and economy saving solution in valve design verification.
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