Abstract
Ge26InxSe74-x thin films were deposited through thermal evaporation process on glass substrates. The characterization of the deposited films have been done by x−ray diffraction [XRD], field emission scanning electron microscope [FESEM] and energy dispersive x−ray spectroscopy [EDX]. The optical properties were also studied by using transmittance and reflectance. Each of absorption coefficient, optical band gap and refractive index were calculated. It is found that the addition of In content decreases the optical band gap. Furthermore, the refractive index was analyzed on the basis of Wemple–Didomenico model. The third-order nonlinear optical susceptibility and the nonlinear refractive index were estimated for investigated films.
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