Abstract
The thin films of Poly (3-methyl thiophene) on glass substrate are prepared by rf plasma polymerization method. The Arrhenious plot of DC conductivity shows straight line behaviour. The optical properties as UVvisible absorption and reflection studies, optical band gap and refractive index studies have been carried out on these samples. The refractive index of the films is determined to be 1.49, dielectric constant 2.24 and band gap to be 2.49 eV at a wavelength 620 nm in the visible region. To check the surface uniformity SEM studies have been carried out of thin films. XRD shows the amorphous nature of Poly (3-methyl thiophene) thin fims.
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More From: International Journal of Advanced Research in Science and Technology
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