Abstract
Polymer-capped silicon nanoparticles (Si NPs) were prepared using poly(vinylpyrrolidone) (PVP) as a protection layer to minimize the surface oxidation of the surface. The wet synthetic procedure were performed at room temperature via a one-pot synthesis. The PVP capped Si-NPs were characterized by thermo gravimetric analysis (TGA), Fourier transform infrared spectroscopy (FT-IR), high resolution transmission electron microscopy (HR-TEM) and field emission scanning electron microscopy (FE-SEM). HR-TEM micrograms confirm the presence of crystalline Si-NPs. The pattern by Selected Area Electron Diffraction (SAED) reveals (111), (220) lattice planes which are consistent with the cubic-structured crystalline silicon. The mean size of Si-NPs is estimated to be ca. 10 nm, which is larger than those from conventional wet synthetic methods for silicon quantum dots.
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