Abstract
The influence of synchrotron radiation (SR) in vacuum-deposited layers of copper phthalocyanine (CuPc) and the influence of the following vacuum thermal development in the positive and negative exposed CuPc layers were investigated by EPR, Raman spectroscopy, UV-visible spectroscopy, X-ray diffraction, mass spectrometry using Knudsen cell. It was established that the layers of α-CuPc possessed EPR anisotropy. The anisotropy decreased with an increase of SR exposure and changed for negative exposed layers and for layers heated at development temperature. For positive exposed and unexposed layers of CuPc, the α → β-phase transition occurred at development temperature, but this process was not observed at development of negative exposed layers. Mass spectra of evaporated CuPc molecules from unexposed and positive exposed layers were similar. Only for negative exposed layers the additional protonated molecules of CuPc were recorded in mass spectra. Unexposed, positive exposed and negative exposed CuPc layers had different temperature dependencies of pressure of evaporated molecules. All measured spectra and dependencies were analysed and SR photochemistry of CuPc layers was discussed.
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