Abstract
Hard X-ray imaging with synchrotron radiation is a powerful tool to study opaque materials on the micro- and nano-lengthscales. Different imaging methods are available with an instrument recently built at Sector 34 of the Advanced Photon Source. In-line phase contrast imaging is performed with micrometer resolution. Increased spatial resolution is achieved using cone-beam geometry. The almost parallel beam is focused with a Kirkpatrick–Baez mirror system. The focal spot serves as a diverging secondary source. An X-ray magnified image of the sample is projected on the detector. For imaging and tomography with sub-100nm resolution, an X-ray full-field microscope has been built. It uses a Kirkpatrick–Baez mirror (KB) as a condenser optic, followed by a micro-Fresnel zone plate (FZP) as an objective lens. The zone plates presently provide 50–85nm spatial resolution when operating the microscope with photon energy between 6 and 12keV. Tomography experiments have been performed with this new device.
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