Abstract
Ferroelectric domain structures of epitaxial SrBi2Ta2O9 (SBT), BaBi4Ti4O15 (BBiT) and Bi4Ti3O12 (BiT) thin films as well as PZT nanostructures have been imaged at the nanometer scale. The surface polarization state was monitored using scanning force microscopy (SFM) and lock-in techniques, by measuring small vibrations of the film surface induced by a small AC voltage applied between a bottom electrode underneath the film and the SFM tip. The local ferroelectric properties were characterized by acquiring local piezoelectric hysteresis loops. The hysteresis loop measurements were interrupted at significant points and the ferroelectric domain configuration was imaged to map the switching of polarization.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
