Abstract
The diffraction intensities of He atoms scattered from vicinal Cu(211) and Cu(511) surfaces have been measured with a high angular resolution over a wide range of incident energies from 8 to 82 meV. Close-coupling scattering calculations with a corrugated Morse potential were performed to obtain the corrugation parameters for the first three complex Fourier coefficients. The energy-dependent corrugation profiles determined from the best fit indicate that the corrugation predicted by a simple hard-sphere model is considerably smeared out at the small electron densities far from the surface probed by the He atoms. A comparison with Eikonal calculations demonstrates that hard corrugated wall Eikonal models are not adequate for the structural analysis of stepped surfaces. \textcopyright{} 1996 The American Physical Society.
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