Abstract

Direct measurement of the surface recombination velocity (SRV) on etched CdS(11 20) and at its interface with several metals (deposited by aqueous solutions and in situ thermal evaporation) was achieved by using ultra-fast time-resolved photoluminescence (PL). The results show that Ag deposition increases the original SRV by about three orders of magnitude while Zn virtually does not change it. The results are discussed in view of the pronounced effects on SRV of reactive and unreactive metals and of the deposition method.

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