Abstract
ABSTRACT We attempted to investigate the surface potential relaxation of ferroelectric thin film domain by using Kelvin probe force microscopy (KFM). To avoid charge suction phenomenon by a grounded tip, the offset voltage was applied to the base line of the pulse trace. It was found that the surface potential contrast decreased in terms of elapsed time. Spreading a charge around domain makes the surface potential contrast decrease. Coulomb force repulsion and retention loss contributed to the spreading of surface charges on the ferroelectric domain. These results help us understand surface potential relaxation of nanoscale ferroelectric domains.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
