Abstract
Lead silicate glasses are currently the most employed glasses for microchannel plates (MCP) and other applications. X-ray photoelectron spectroscopy was used to determine the distribution and variation of surface composition of lead silicate glasses during hydrogen reduction. The results showed that the binding energy of silicon, sodium, potassium, magnesium, barium and cesium did not change. However, the content of metal elements is gradually increased increases, while the alkali metal ions and alkaline earth metal ions migrate to the surface. At the same time, the bridge oxygen and non-bridge oxygen content also changed. All the changes of valence and content of elements on glass surface eventually lead to the change of electrical properties of MCPs.
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