Abstract
Amorphous BiSrCaCuO thick films were prepared using a rapid solidification method. The T c ( R=0) was 101 K after a proper heat treatment. X-ray analysis showed that the higher T c sample had more c=37.1 A ̊ phase than the lower T c samples. The sensitive dependence of T c on electric current and heat treatment could be explained by the different morphologies of the samples as seen in SEM pictures. In situ hot stage X-ray analysis of the amorphous thick films allowed study of the crystallization process.
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