Abstract
Much attention has been focused on the effects of the disk substrate in optical data storage. In particular, substrate birefringence has been studied extensively because it causes significant problems in magneto-optic systems. We investigate certain subtle effects of the substrate, such as feedback into the laser diode, in compact disk and phase-change systems. Our analysis of the compact disk system led us to discover a new technique for the rapid measurement of the substrate birefringence. We also address the question of how focusing the laser beam through the substrate will affect the depth of focus.
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