Abstract
We have generated an almost periodic step structure of c-axis-oriented YBa 2Cu 3O 7−δ films grown on 10° miscut SrTiO 3(001) substrates. Combined scanning tunneling microscopy and cross-sectional transmission electron microscopy studies reveal that this growth morphology is linked to an anisotropic defect microstructure. We present evidence that translational boundaries contribute to strong flux pinning in our films. The resistivity and critical current density in the miscut-grown YBa 2Cu 3O 7−δ films have been found to be anisotropic.
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