Abstract
Auger electron spectroscopy (AES) and cross sectional transmission electron microscopy (XTEM) have been applied to study the diffusion barriers at the interface between the Sendust based film and the ferrite core in the MIG heads. A transition zone containing Al 2O 3 was observed by XTEM at the interface of ferrite / Sendust after annealing at 550°C for 1 h. W and Mo films were found to be effective diffusion barriers, whereas Cr and Au films were found to be rather ineffective. The reduction of ripple less than 1.5 dB in the head with W barrier layer was attributed to the decrease of the pseudo-gap length due to the diffusion barrier effect. This playback performance correlates well with the AES and XTEM results.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
