Abstract
In the manufacture of precision electronic components, defects are detected using automatic inspection machines. When high inspection sensitivity is employed, the group of potentially defective candidates identified by the inspection machine can include many acceptable units; this can ultimately lead to an excessive number of incorrect defect detections. This study aims to develop an effective method for classifying images of defect candidates into defect images and good images. Herein, the inspection method of electronic components with various defective images generated from the true defect images is proposed.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callMore From: Journal of the Japan Society for Precision Engineering
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
