Abstract
In this study, a new method employing scattering parameters (SPs) method, genetic algorithm (GA) and Levenberg–Marquardt algorithm (LM) is proposed for modelling conducted electromagnetic interference (EMI) noise source impedance. On the basis of the impedance information extracted by traditional SP method, GA is adopted to optimise the impedance information by taking advantage of the fast convergence speed. The obtained values of the RCL parameter are used as a set of initial values. Then, by using the advantage of the high precision of the LM, the initial values obtained by the GA are iteratively calculated. Better results can be obtained by using this combination method. This method improves the processing accuracy while ensuring the processing speed and contributes to the design of conduction EMI filter.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
