Abstract
ABSTRACT In this study, we attempted to examine the properties of La-substituted bismuth titanate (BLT) thin film utilizing piezoresponse force microscope (PFM). BLT thin films were made using two step rapid thermal annealing (RTA). Three BLT thin films with random crystallographic orientation were obtained by varying the RTA conditions. AFM images show that the BLT thin film consists of three distinct shapes of grains. Each grain revealed different piezoresponse according to their shapes. Therefore, we investigated the relationship between the shape of a grain and polarization orientation. In addition, we studied grain polarization by monitoring the difference between the initial PFM image and PFM image after poling using 3D PFM. It is very useful to understand the piezoresponse in terms of polarization. Furthermore, it provides information about the domain motion in the BLT thin film with random crystallographic orientation.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
