Study of the oxidation of gold-tin preforms using x-ray photoelectron spectroscopy

Abstract

This study uses x-ray photoelectron spectroscopy (XPS) to investigate the nature of the oxide formed on clean Au–Sn binary alloys (ζ and δ phases) and on preforms with the eutectic composition (29 at % Sn) at low O2 pressures (<10−3 Torr) and at high O2 pressures (up to one atmosphere) at temperatures ranging from room temperature to 200 °C. Sn Auger parameters and XPS angular-resolved data were obtained in addition to the core binding energies to identify the oxide layer. The oxidation of the Au–Sn alloys is basically similar to the oxidation of metallic Sn. The Auger parameter indicates that with low-pressure oxidation a layered oxide structure is formed consisting of SnO and a slightly tin-rich oxide at the interface. Probably a thin skin of Sn(IV) oxide exists on the outer surface of the low-pressure oxide. High-temperature and low-pressure promotes the growth of SnO. As the pressure is increased the Sn(IV) oxide grows more noticeably and with high-pressure oxidation the Sn(IV) oxide grows thicker than the Sn(II) oxide at the interface. The Sn(II) oxide at the interface appears similar to the Sn(II) oxide structure formed at low pressure. The Auger parameter indicates that the Sn(IV) oxide possesses a structure different than that of Cassiterite.