Abstract
In studies of large amplitude burst noise in bipolar transistors it has proved possible in some instances to characterise the defect current before and after dramatic changes in its behavior. Changes studied include transformations in waveforms and complete disappearance of the burst noise sources. Significant differences in I– V curves and activation energies of the current have been observed after the transformations. The results support the theory that burst noise is produced by multi-defect systems.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
