Abstract
Investigation of strain and residual stress in materials plays an important role in evaluation of the lifetime of machine components. Various methods have been also developed to determine the strains and residual stresses. X-ray diffraction is often used technique to measure the residual stress in the surface material, while layer removal method is common applied to determine the in-depth residual stress distribution. This paper will present the technique combining the X-ray diffraction with layer removal method to study of the strain and residual stress distribution in the thickness direction on JIS S45C quenched specimen. The result of the strain and residual stress distribution through the thickness direction are determined, in which the residual stress distribution is the inhomogeneous.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
