Abstract

Scratch-induced mechanical damage on silicon (111) surfaces, in particular the fractures, residual strain fields and anneal-induced dislocations generated by <112> and <110> direction scratches, is investigated by optical microscopy, X-ray diffraction topography and the copper decoration method. The asymmetry in this damage in the [112̄] and reverse [1̄1̄2] directions is observed. The asymmetries are correlated with each other and are discussed in terms of the inclined (111̄) cleavage plane whose intersection with the (111) surface is perpendicular to the <112> direction.

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.