Abstract
The output properties of hydrogen light sources and the resist parameters, such as spectral sensitivity and absorption coefficient, in the vacuum-ultraviolet (VUV) region were investigated. A very low exposure energy of about 1 mJ/cm2 was obtained by employing a very thin polymethyl methacrylate film and the VUV light of hydrogen microwave discharge. Contact photolithography using a Si/MgF2 mask and a trilayer resist system showed that submicron patterns as small as 0.2 µm had been replicated at an exposure time of under 30 s.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
