Abstract
AC impedance spectroscopic measurements have been performed on sol–gel derived zinc oxide (ZnO) films on transparent fluorine-doped tin oxide coated glass substrates in the frequency range 10−2 to 106 Hz over the temperature range −185 to +25 °C (88–298 K). The relaxation behaviour of the nanocrystal line ZnO thin film can be described in terms of the Debye model giving an interpretation of the semi-circular relaxation phenomenon within the given temperature range. Two different relaxation times were obtained from impedance (Z) and electric modulus (M) studies of the devices and the multiple hopping of charge carriers between trap sites in grain and grain-boundary regions is believed to be responsible for charge transport. The values of activation energies for trap levels obtained from AC conductivity study are 0.0153 and 0.0487 eV which are close to the activation energies obtained from DC electrical measurement for temperature region between 88 and 178 K and 179 and 298 K, respectively.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
More From: Journal of Materials Science: Materials in Electronics
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.