Studies on the structural and magnetic properties of PMMA/Ni nanocomposite system prepared by embedding Ni nanoparticles in the PMMA films

Abstract

PMMA/Ni nanocomposite films have been prepared by embedding Ni nanoparticles and maintaining their different thickness (5–50 nm) in PMMA (polymethylmethacrylate) film matrix by using ion beam sputtering (IBS) technique. Grazing incidence x-ray diffraction (GIXRD) results reveal Ni is present in metallic form in the FCC phase. X-ray reflectivity (XRR) is used to measure the nominal thickness of the Ni nanoparticle layer. Surface morphology was studied using atomic force microscopes (AFM). SXAS (soft x-ray absorption spectroscopy) studies on PMMA/Ni nanocomposites were done using synchrotron radiation to understand the electronic structure of these films which reveals that Ni is present in metallic state confirming that PMMA as host matrix protects the magnetic Ni nanoparticles from external oxidation. The magneto-optical Kerr effect (MOKE) magnetometer and MOKE microscope were employed to study the magnetic properties and simultaneously record the real time evolution of magnetic domains at 0°, 45°, and 90° azimuthal angles. All films show soft ferromagnetic behaviour and all the films show isotropic behaviour except one with Ni nanoparticle layer thickness of 40 nm. MOKE micrographs witness the gradual growth of magnetic domains with increase in thickness of Ni nanoparticle layer. These PMMA/Ni nanocomposite films may be viewed as potential candidate for futuristic functional material.